Jointly organized by IEEE Antenna Propagation Society (AP-S) Student Branch Chapter (SBC), IEEE Microwave Theory and Technology (MTT-S) SBC, IEEE Sensors Council SBC, School of Electronics Engineering, KIIT (DU), Bhubaneswar, India, IEEE Sensor Council Bhubaneswar Chapter, IEEE APS/MTT-S joint Chapter, Bhubaneswar, IEEE KIIT Student Branch Chapter and IEEE Bhubaneswar Section.
Event Details:
- Title of the Distinguished Lecture Talk: Microwave Sensors for Dielectric Material Characterization and Imaging Application
- Speaker: Dr. Surya Prakash Singh, IIIT Bhubaneswar, Gothapatna, Bhubaneswar-751003
- Date: 16th March 2026 (Monday)
- Time: 6:00 PM to 7:00 PM
- Venue (Physical Location): Conference Hall, New Building, School of Electronics Engineering, Campus-12, KIIT (DU)
- Mode: Offline
- Number of Participants: 20
- Purpose of the Event: Academic knowledge enhancement and social awareness and outreach
Write-up on the Event:
The IEEE Distinguished Lecture Talk on “Microwave Sensors for Dielectric Material Characterization and Imaging Application,” held on 16th March 2026 at the School of Electronics Engineering, KIIT (Deemed to be University), Bhubaneswar, was a highly collaborative and technically enriching event aimed at advancing knowledge in sensor technologies and electromagnetic applications. This lecture was jointly organized by multiple IEEE bodies including the IEEE Antennas and Propagation Society (AP-S) SBC, IEEE Microwave Theory and Technology (MTT-S) SBC, IEEE Sensors Council SBC, IEEE Sensor Council Bhubaneswar Chapter, IEEE APS/MTT-S Joint Chapter Bhubaneswar, IEEE KIIT Student Branch, and IEEE Bhubaneswar Section, reflecting a strong interdisciplinary and institutional collaboration. Conducted from 6:00 PM to 7:00 PM in offline mode at the Conference Hall, New Building, the session witnessed the participation of 20 students and researchers in an interactive academic environment. The lecture was delivered by Dr. Surya Prakash Singh from IIIT Bhubaneswar, whose expertise provided valuable insights into advanced microwave sensing techniques. A key highlight of the session was the discussion on the use of microwave sensors for dielectric material characterization and imaging applications, with emphasis on accuracy, non-invasive measurement, and practical implementations. The primary objective of the event was to enhance academic knowledge while promoting social awareness and outreach in advanced sensing technologies. Participants gained exposure to real-world applications in material science and imaging systems. Overall, the lecture successfully strengthened technical understanding and inspired students to explore research opportunities in microwave and sensor-based technologies.
